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Conductive Atomic Force Microscopy. Applications in Nanomaterials, Hardback/*** - Wiley-VCH Verlag GmbH


Conductive Atomic Force Microscopy. Applications in Nanomaterials, Hardback/***
879.99 Lei

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(16-11-2024)
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The first book to summarize the Applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale..
The first book to summarize the Applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.


Uneori, aceste descrieri pot contine inadvertente. De asemenea, imaginea este informativa si poate contine accesorii neincluse in pachetele standard.

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Conductive Atomic Force Microscopy. Applications in Nanomaterials, Hardback/***

Conductive Atomic Force Microscopy. Applications in Nanomaterials, Hardback/***

 Lei879.99
Detalii

Conductive Atomic Force Microscopy |

Conductive Atomic Force Microscopy |

 Lei897.8
Detalii

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