Description Completely up-to-date, this is the first comprehensive monograph on Metal Oxide varistors with a focus on microstructure, conduction mechanisms, device failures, ageing, additive impacts and future varistor systems.
He was elected a Fellow of IEEE in 2007 and a Fellow of IET in 2011 for his contribution to lightning protection and grounding technology in power transmission system, and a Fellow of HPEM in 2018 for contrib.
He has published 5 academic monographs, and 2 textbooks.
He has co-authored more than 310 papers in peer-reviewed international journals and transactions and more than 200 papers in refereed Chinese-language journals.
During 2014 to 2018, he had been assigned by China Science and Technology Ministry as the Chief Scientist in charge of a 5-year China National Fundamental Research Project.
His research interests cover dielectric materials and electroceramics, transient electromagnetics and electromagnetic compatibility in power systems and electronic systems as well as advanced power transmission technology.
Currently Jinliang He is the Chair of the High Voltage and Insulation Technology Research Institute at the Tsinghua University.
About the Author Jinliang He is the Chang Jiang Scholars Distinguished Professor of China\'s Ministry of Education with the Department of Electrical Engineering of the Tsinghua University, Beijing, China.
In addition, he looks at future directions for varistor research, such as Zn O varistors with a high voltage gradient and low residual voltage and further varistor types based on Ti O2 and Sn O2.
The author reflects on the achievements made in varistor research and propose new approaches to analyze and predict the macro-characteristics, employing such methods as micro-contact measurements and numerical simulations.
As such, it covers the fundamentals and applications of Metal Oxide varistors, including their macro-characteristics, microstructural properties and the device-internal physical and electrical mechanisms.
Description Completely up-to-date, this is the first comprehensive monograph on Metal Oxide varistors with a focus on microstructure, conduction mechanisms, device failures, ageing, additive impacts and future varistor systems
