Descriere
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Cumpara scanning electron microscopy springer-verlag new york inc. de calitate.
Pe yeo poti sa gasesti cel mai bun pret pentru scanning electron microscopy springer-verlag new york inc.
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of Scanning Electron Microscopy (SEM) and X-Ray microanalysis.
The authors emphasize the practical aspects of the techniques described..
An ideal text for students as well as practitioners, this is a comprehensive introduction to the field of Scanning Electron Microscopy (SEM) and X-Ray microanalysis
Uneori, aceste descrieri pot contine inadvertente. De asemenea, imaginea este informativa si poate contine accesorii neincluse in pachetele standard.
