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Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, Paperback/Fred Stevie - Momentum Press


Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization, Paperback/Fred Stevie
486 Lei

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(27-06-2024)
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Cumpara secondary ion mass momentum press de calitate.
Pe yeo poti sa gasesti cel mai bun pret pentru secondary ion mass momentum press

Description This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained.
About the Author Senior Researcher, North Carolina State University.
The book has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
It also will serve as a reference for those who need to provide SIMS data.
Description This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained


Uneori, aceste descrieri pot contine inadvertente. De asemenea, imaginea este informativa si poate contine accesorii neincluse in pachetele standard.
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